1. Broadband Microwave-Based Metrology Platform Development: Demonstration of In-Situ Failure Mode Diagnostic Capabilities for Integrated Circuit Reliability Analyses. (7th November 2014) Authors: You, Lin; Okoro, Chukwudi A.; Ahn, Jung-Joon; Kopanski, Joseph; Franklin, Rhonda R.; Obeng, Yaw S. Journal: ECS journal of solid state science and technology Issue: Volume 4:Number 1(2015) Page Start: N3113 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗