1. Structural characteristics of 3C–SiC thin films grown on Si-face and C-face 4H–SiC substrates by high temperature chemical vapor deposition. (January 2023) Authors: Feng, Zhe Chuan; Lin, Hao-Hsiung; Xin, Bin; Tsai, Shi-Jane; Saravade, Vishal; Yiin, Jeffrey; Klein, Benjamin; Ferguson, Ian T. Journal: Vacuum Issue: Volume 207(2023) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗