1. Comprehensive study on hot carrier reliability of radiation hardened H-gate PD SOI NMOSFET after gamma radiation. Issue 7 (3rd August 2019) Authors: Zhao, Jinghao; Zhou, Hang; Cui, Jiangwei; Zheng, Qiwen; Wei, Ying; Xi, Shanxue; Yu, Xuefeng; Guo, Qi Journal: Radiation effects and defects in solids Issue: Volume 174:Issue 7/8(2019) Page Start: 606 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. Modeling of TID-induced leakage current in ultra-deep submicron SOI NMOSFETs. (August 2020) Authors: Xi, Shanxue; Zheng, Qiwen; Lu, Wu; Cui, Jiangwei; Wei, Ying; Guo, Qi Journal: Microelectronics journal Issue: Volume 102(2020) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
3. Research on the Performance of Nuclear Battery with SiC-Schottky and GaN-PIN Structure. (4th May 2022) Authors: Xi, Shanxue; Li, Haijun; Li, Linxiang; Wu, Kun; Huang, Guangwei; Wang, Zungang; Zhang, Yiyun; Zhou, Chunzhi Journal: Nuclear technology Issue: Volume 208:Number 5(2022) Page Start: 922 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
4. Researches on the performance of GaN-PIN betavoltaic nuclear battery. Issue 3 (3rd April 2022) Authors: Xi, Shanxue; Li, Linxiang; Zhou, Chunzhi; Li, Haijun; Huang, Guangwei; Wu, Kun; Wang, Zungang; Zhang, Yiyun Journal: Radiation effects and defects in solids Issue: Volume 177:Issue 3/4(2022) Page Start: 213 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
5. The influence of total ionizing dose on the hot carrier injection of 22 nm bulk nFinFET. (December 2020) Authors: Wang, Baoshun; Cui, Jiangwei; Guo, Qi; Zheng, Qiwen; Wei, Ying; Xi, Shanxue Journal: Journal of semiconductors Issue: Volume 41:Number 12(2020) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗