1. Aging‐time‐resolved in situ microstructural investigation of tin films electroplated on copper substrates, applying two‐dimensional‐detector X‐ray diffraction. (25th October 2013) Authors: Stein, Jendrik; Welzel, Udo; Huegel, Werner; Blatt, Sabine; Mittemeijer, Eric Jan Journal: Journal of applied crystallography Issue: Volume 46:Part 6(2013:Dec.) Page Start: 1645 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. Diffraction stress analysis of highly planar‐faulted, macroscopically elastically anisotropic thin films and application to tensilely loaded nanocrystalline Ni and Ni(W). (4th February 2014) Authors: Kurz, Silke Julia Birgit; Welzel, Udo; Bischoff, Ewald; Mittemeijer, Eric Jan Journal: Journal of applied crystallography Issue: Volume 47:Part 1(2014:Feb.) Page Start: 291 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
3. Modern diffraction methods. (2013) Other Names: Mittemeijer, E. J; Welzel, Udo Record Type: Book Extent: 1 online resource (554 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗