Modern diffraction methods. (2013)

• Record Type: Book
• Further Information: Note: Edited by Eric J. Mittemeijer and Udo Welzel.
• Other Names: Mittemeijer, E. J; Welzel, Udo
• Contents: PREFACE; ; PART I: Structure Determination; ; STRUCTURE DETERMINATION OF SINGLE CRYSTALS; Introduction; The Electron Density; Diffraction and the Phase Problem; Fourier Cycling and Difference Fourier Maps; Statistical Properties of Diffracted Intensities; The Patterson Function; Patterson Search Methods; Direct Methods; Charge Flipping and Low-Density Elimination; Outlook and Summary; ; MODERN RIETVELD REFINEMENT, A PRACTICAL GUIDE; The Peak Intensity; The Peak Position; The Peak Profile; The Background; The Mathematical Procedure; Agreement Factors; Global Optimization Method of Simulated Annealing; Rigid Bodies; Introduction of Penalty Functions; Parametric Rietveld Refinement; ; STRUCTURE OF NANOPARTICLES FROM TOTAL SCATTERING; Introduction; Total Scattering Experiments; Structure Modeling and Refinement; Examples; Outlook; ; PART II: Analysis of the Microstructure; ; DIFFRACTION-LINE PROFILE ANALYSIS; Introduction; Instrumental Broadening; Structural Specimen Broadening; Practical Application of Line Profile Analysis; Conclusions; ; RESIDUAL STRESS ANALYSIS BY X-RAY DIFFRACTION METHODS; Introduction; Principles of Near-Surface X-Ray Residual Stress Analysis; Near-Surface X-Ray Residual Stress Analysis by Advanced and Complementary Methods; Final Remarks; ; STRESS ANALYSIS BY NEUTRON DIFFRACTION; Introductory Remarks; Fundamentals of the Technique; Instrumentation; Capabilities; Examples; ; TEXTURE ANALYSIS BY ADVANCED DIFFRACTION METHODS; Introduction and Background; Synchrotron X-Rays; Neutron Diffraction; Electron Diffraction; Comparison of Methods; Conclusions; SURFACE-SENSITIVE X-RAY DIFFRACTION METHODS; Introduction; X-Ray Reflectivity; Bragg Scattering in Reduced Dimensions (Crystal Truncation Rod Scattering); Grazing Incidence X-Ray Diffraction; Experimental Geometries; Trends; THE MICRO- AND NANOSTRUCTURE OF IMPERFECT OXIDE EPITAXIAL FILMS; The Diffracted Amplitude and Intensity; The Correlation Volume; Lattice Strain; Example; Strain Gradients; Conclusions; ; PART III: Phase Analysis and Phase Transformations; ; QUANTITATIVE PHASE ANALYSIS USING THE RIETVELD METHOD; Introduction; Mathematical Basis; Applications in Minerals and Materials Research; Summary; ; KINETICS OF PHASE TRANSFORMATIONS AND OF OTHER TIME-DEPENDENT PROCESSES IN SOLIDS ANALYZED BY POWDER DIFFRACTION; Introduction; Kinetic Concepts; Tracing the Process Kinetics by Powder Diffraction; Mode of Measurement: In Situ versus Ex Situ Methods; Types of Kinetic Processes and Examples; Concluding Remarks; ; PART IV: Diffraction Methods and Instrumentation; ; LABORATORY INSTRUMENTATION FOR X-RAY POWDER DIFFRACTION: DEVELOPMENTS AND EXAMPLES; Introduction: Historical Sketch; Laboratory X-Ray Powder Diffraction: Instrumentation; Examples; ; THE CALIBRATION OF LABORATORY X-RAY DIFFRACTION EQUIPMENT USING NIST STANDARD REFERENCE MATERIALS; Introduction; The Instrument Profile Function; SRMs, Instrumentation, and Data Collection Procedures; Data Analysis Methods; Instrument Qualification and Validation; Conclusions; ; SYNCHROTRON DIFFRACTION: CAPABILITIES, INSTRUMENTATION, AND EXAMPLES; Introduction; The Underlying Physics of Synchrotron Sources; Diffraction Applications Exploiting High Source Brilliance; High Q-Resolution Measurements; Applications of Tunability: Resonant Scattering; Future: Ultrafast Science and Coherence; ; HIGH-ENERGY ELECTRON DIFFRACTION: CAPABILITIES, INSTRUMENTATION, AND EXAMPLES; Introduction; Instrumentation; Electron Diffraction Methods in the TEM; Summary and Outlook; ; IN SITU DIFFRACTION MEASUREMENTS: CHALLENGES, INSTRUMENTATION, AND EXAMPLES; Introduction; Instrumentation and Experimental Challenges; Examples; ; INDEX;
• Publisher Details: Place of publication not identified : Wiley-VCH
• Publication Date: 2013
• Extent: 1 online resource (554 pages)
• Subjects: 548.83; Diffraction; X-rays -- Diffraction; Electrons -- Diffraction; Neutrons -- Diffraction; Microstructure
• Languages: English
• ISBNs: 9783527649907
• Access Rights: Legal Deposit; Only available on premises controlled by the deposit library and to one user at any one time; The Legal Deposit Libraries (Non-Print Works) Regulations (UK).
• Access Usage: Restricted: Printing from this resource is governed by The Legal Deposit Libraries (Non-Print Works) Regulations (UK) and UK copyright law currently in force.