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You searched for: Author/Creator Wang, Chin-I

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1. Dielectric properties and reliability enhancement of atomic layer deposited thin films by in situ atomic layer substrate biasing. Issue 37 (7th September 2020)

3. Ferroelectric ZrO2 ultrathin films on silicon for metal-ferroelectric-semiconductor capacitors and transistors. Issue 15 (December 2022)

5. Suppression of short channel effects in ferroelectric Si junctionless transistors with a sub-10 nm gate length defined by helium ion beam lithography. Issue 26 (17th June 2021)