1. 16-Channel micro magnetic flux sensor array for IGBT current distribution measurement. Issue 9 (August 2015) Authors: Tomonaga, H.; Tsukuda, M.; Okoda, S.; Noda, R.; Tashiro, K.; Omura, I. Journal: Microelectronics and reliability Issue: Volume 55:Issue 9/10(2015) Page Start: 1357 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. A fully digital feedback control of gate driver for current balancing of parallel connected power devices. (September 2018) Authors: Tripathi, R.N.; Tsukuda, M.; Omura, I. Journal: Microelectronics and reliability Issue: Volume 88/90(2018) Page Start: 505 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
3. A testing method for evaluating shoot-through immunity of IGBTs in an inverter. (November 2021) Authors: Hasegawa, K.; Abe, S.; Tsukuda, M.; Omura, I.; Ninomiya, T. Journal: Microelectronics and reliability Issue: Volume 126(2021) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
4. Bias voltage criteria of gate shielding effect for protecting IGBTs from shoot-through phenomena. (September 2018) Authors: Tsukuda, M.; Abe, S.; Hasegawa, K.; Ninomiya, T.; Omura, I. Journal: Microelectronics and reliability Issue: Volume 88/90(2018) Page Start: 482 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
5. Calculation of single event burnout failure rate for high voltage devices under satellite orbit without fitting parameters. (September 2019) Authors: Sudo, M.; Nagamatsu, T.; Tsukuda, M.; Omura, I. Journal: Microelectronics and reliability Issue: Volume 100/101(2019) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
6. Clamp type built-in current sensor using PCB in high-voltage power modules. (September 2017) Authors: Tsukuda, M.; Nakashima, K.; Tabata, S.; Hasegawa, K.; Omura, I. Journal: Microelectronics and reliability Issue: Volume 76/77(2017) Page Start: 517 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
7. Development of fast short-circuit protection system for advanced IGBT. (September 2019) Authors: Ichiki, M.; Arimoto, T.; Abe, S.; Tsukuda, M.; Omura, I. Journal: Microelectronics and reliability Issue: Volume 100/101(2019) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
8. Failure analysis of power devices based on real-time monitoring. Issue 9 (August 2015) Authors: Watanabe, A.; Tsukuda, M.; Omura, I. Journal: Microelectronics and reliability Issue: Volume 55:Issue 9/10(2015) Page Start: 2032 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
9. High-throughput and full automatic DBC-module screening tester for high power IGBT. Issue 9 (August 2015) Authors: Tsukuda, M.; Tomonaga, H.; Okoda, S.; Noda, R.; Tashiro, K.; Omura, I. Journal: Microelectronics and reliability Issue: Volume 55:Issue 9/10(2015) Page Start: 1363 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
10. Micro PCB Rogowski coil for current monitoring and protection of high voltage power modules. (September 2016) Authors: Tsukuda, M.; Koga, M.; Nakashima, K.; Omura, I. Journal: Microelectronics and reliability Issue: Volume 64(2016) Page Start: 479 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗