1. Si Doped Hafnium Oxide—A "Fragile" Ferroelectric System. (22nd August 2017) Authors: Richter, Claudia; Schenk, Tony; Park, Min Hyuk; Tscharntke, Franziska A.; Grimley, Everett D.; LeBeau, James M.; Zhou, Chuanzhen; Fancher, Chris M.; Jones, Jacob L.; Mikolajick, Thomas; Schroeder, Uwe Journal: Advanced Electronic Materials Issue: Volume 3:Number 10(2017) Page Start: n/a Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗