1. Effect of doping on Al2O3/GaN MOS capacitance. (August 2022) Authors: Rrustemi, B.; Piotrowicz, C.; Jaud, M-A.; Triozon, F.; Vandendaele, W.; Mohamad, B.; Gwoziecki, R.; Ghibaudo, G. Journal: Solid-state electronics Issue: Volume 194(2022) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. Modeled optical properties of SiGe and Si layers compared to spectroscopic ellipsometry measurements. (March 2017) Authors: Kriso, C.; Triozon, F.; Delerue, C.; Schneider, L.; Abbate, F.; Nolot, E.; Rideau, D.; Niquet, Y.-M.; Mugny, G.; Tavernier, C. Journal: Solid-state electronics Issue: Volume 129(2017) Page Start: 93 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
3. Poisson-Schrödinger simulation and analytical modeling of inversion charge in FDSOI MOSFET down to 0 K – Towards compact modeling for cryo CMOS application. (December 2021) Authors: Aouad, M.; Poiroux, T.; Martinie, S.; Triozon, F.; Vinet, M.; Ghibaudo, G. Journal: Solid-state electronics Issue: Volume 186(2021) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
4. Strain effect on mobility in nanowire MOSFETs down to 10 nm width: Geometrical effects and piezoresistive model. (November 2016) Authors: Pelloux-Prayer, J.; Cassé, M.; Triozon, F.; Barraud, S.; Niquet, Y.-M.; Rouvière, J.-L.; Faynot, O.; Reimbold, G. Journal: Solid-state electronics Issue: Volume 125(2016) Page Start: 175 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
5. Strain effect on mobility in nanowire MOSFETs down to 10 nm width: Geometrical effects and piezoresistive model. (November 2016) Authors: Pelloux-Prayer, J.; Cassé, M.; Triozon, F.; Barraud, S.; Niquet, Y.-M.; Rouvière, J.-L.; Faynot, O.; Reimbold, G. Journal: Solid-state electronics Issue: Volume 125(2016) Page Start: 175 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗