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Author/Creator Tougaard, Sven

2. Effects of cation compositions on the electronic properties and optical dispersion of indium zinc tin oxide thin films by electron spectroscopy. (February 2015)

Authors:
Denny, Yus Rama; Seo, Soonjoo; Lee, Kangil; Oh, Suhk Kun; Kang, Hee Jae; Heo, Sung; Chung, Jae Gwan; Lee, Jae Cheol; Tougaard, Sven
Journal:
Materials research bulletin
Issue:
Volume 62(2015:Feb.)
Page Start:
222
Record Type:
Journal Article
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3. Improved depth information from routine analysis of the inelastic background of XPS and HAXPES spectra using optimized two‐ and three‐parameter cross‐sections. (30th September 2021)

Authors:
Zborowski, Charlotte; Tougaard, Sven
Other Names:
Gilmore Ian S. guestEditor.; Watts John F. guestEditor.
Journal:
Surface and interface analysis
Issue:
Volume 54:Number 4(2022)
Page Start:
433
Record Type:
Journal Article
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5. Inelastic background analysis of HAXPES spectra: towards enhanced bulk sensitivity in photoemission1. (15th May 2014)

Authors:
Risterucci, Paul; Renault, Olivier; Martinez, Eugénie; Detlefs, Blanka; Zegenhagen, Jorg; Grenet, Geneviève; Tougaard, Sven; Abel, Marie‐Laure; Rossi, Antonella; Watts, John F.
Journal:
Surface and interface analysis
Issue:
Volume 46:Number 10/11(2014)
Page Start:
906
Record Type:
Journal Article
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8. Proliferation of Faulty Materials Data Analysis in the Literature. (February 2020)

Authors:
Linford, Matthew R.; Smentkowski, Vincent S.; Grant, John T.; Brundle, C. Richard; Sherwood, Peter M.A.; Biesinger, Mark C.; Terry, Jeff; Artyushkova, Kateryna; Herrera-Gómez, Alberto; Tougaard, Sven; Skinner, William; Pireaux, Jean-Jacques; McConville, Christopher F.; Easton, Christopher D.; Gen...
Journal:
Microscopy and microanalysis
Issue:
Volume 26:Number 1(2020)
Page Start:
1
Record Type:
Journal Article
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