1. Discrimination of positional isomers by ion mobility mass spectrometry: application to organic semiconductors. Issue 20 (15th May 2018) Authors: Duez, Quentin; Romain, Maxime; Tonneaux, Corentin; De Winter, Julien; Lemaur, Vincent; Cornil, Jérôme; Poriel, Cyril; Gerbaux, Pascal Journal: Analytical methods Issue: Volume 10:Issue 20(2018) Page Start: 2303 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗