Discrimination of positional isomers by ion mobility mass spectrometry: application to organic semiconductors. Issue 20 (15th May 2018)

• Record Type: Journal Article
• Authors: Duez, Quentin; Romain, Maxime; Tonneaux, Corentin; De Winter, Julien; Lemaur, Vincent; Cornil, Jérôme; Poriel, Cyril; Gerbaux, Pascal
• Is Part Of: Analytical methods. Volume 10:Issue 20(2018)
• Page Start: 2303
• Page End: 2306
• Publication Date: 2018-05-15
• Subjects: Chemistry, Analytic -- Periodicals; Analytical biochemistry -- Periodicals; Chemical laboratories -- Standards -- Periodicals; 543.1905
• DOI: 10.1039/c8ay00568k
• Languages: English
• ISSNs: 1759-9660

Abstract

Abstract : Ion mobility mass spectrometry is introduced as a versatile technique for positional isomerism discrimination in the field of organic-based optoelectronics. Abstract : Organic semiconductors are increasingly being used in organic-based opto-electronic devices. Since regioselective synthetic approaches are not always controlled, promising compounds are sometimes prepared following non-regioselective routes. Ion mobility mass spectrometry is here introduced as a direct method to distinguish isomers in mixtures, instead of undertaking time-consuming analytical chromatography procedures.