1. 10.4: Non‐Contact Current Measurements for AMOLED Backplanes Using Electron‐Beam‐Induced Plasma Probes. Issue 1 (June 2015) Authors: Saleh, Ned; Sterling, Enrique; Toet, Daniel Journal: Digest of technical papers Issue: Volume 46:Issue 1(2015) Page Start: 118 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗