1. Continuous and symmetric trans-capacitance compact model for triple-gate junctionless MOSFETs. (January 2021) Authors: Oproglidis, T.A.; Tsormpatzoglou, A.; Tassis, D.H.; Theodorou, C.G.; Ghibaudo, G.; Dimitriadis, C.A. Journal: Solid-state electronics Issue: Volume 175(2021) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. Corrigendum to "Drain current local variability analysis in nanoscale junctionless FinFETs utilizing a compact model" [Solid-State Electron. 170 (2020) 107835]. (September 2020) Authors: Oproglidis, T.A.; Tassis, D.H.; Tsormpatzoglou, A.; Ghibaudo, G.; Dimitriadis, C.A. Journal: Solid-state electronics Issue: Volume 171(2020) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
3. Drain current local variability analysis in nanoscale junctionless FinFETs utilizing a compact model. (August 2020) Authors: Oproglidis, T.A.; Tassis, D.H.; Tsormpatzoglou, A.; Ghibaudo, G.; Dimitriadis, C.A. Journal: Solid-state electronics Issue: Volume 170(2020) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
4. Threshold voltage of p-type triple-gate junctionless transistors. (November 2022) Authors: Oproglidis, T.A.; Tassis, D.H.; Tsormpatzoglou, A.; Karatsori, T.A.; Theodorou, C.G.; Barraud, S.; Ghibaudo, G.; Dimitriadis, C.A. Journal: Solid-state electronics Issue: Volume 197(2022) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗