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Author/Creator Tasker, Paul J. Journal Microelectronics and reliability

1. Study of hot electrons in AlGaN/GaN HEMTs under RF Class B and Class J operation using electroluminescence. Issue 12 (December 2015)

Authors:
Brazzini, Tommaso; Casbon, Michael A.; Sun, Huarui; Uren, Michael J.; Lees, Jonathan; Tasker, Paul J.; Jung, Helmut; Blanck, Hervé; Kuball, Martin
Journal:
Microelectronics and reliability
Issue:
Volume 55:Issue 12 Part A(2015)
Page Start:
2493
Record Type:
Journal Article
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