Author/Creator: Tang, Shun-Wei - British Library Electronic Legal Deposit Catalogue-Journal Issues and Articles Search Results

Author/Creator Tang, Shun-Wei

1. Analysis of the subthreshold characteristics in AlGaN/GaN HEMTs with a p-GaN gate. (November 2021)

Authors:: Tang, Shun-Wei; Chen, Szu-Chia; Wu, Tian-Li
Journal:: Microelectronics and reliability
Issue:: Volume 126(2021)
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Record Type:: Journal Article
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2. Demonstration of Schottky barrier diode integrated in 200 V power p-GaN HEMTs technology with robust stability. (July 2022)

Authors:: Gallardo, Jethro Oroceo; Dash, Sachidananda; Tran, Thanh Nga; Huang, Zhen-Hong; Tang, Shun-Wei; Wellekens, Dirk; Bakeroot, Benoit; Syshchyk, Olga; De Jaeger, Brice; Decoutere, Stefaan; Wu, Tian-Li
Journal:: Microelectronics and reliability
Issue:: Volume 134(2022)
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Record Type:: Journal Article
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3. Investigation of the degradations in power GaN-on-Si MIS-HEMTs subjected to cumulative γ-ray irradiation. (September 2019)

Authors:: Sharma, Chandan; Modolo, Nicola; Chen, Hsi-Han; Tseng, Yang-Yan; Tang, Shun-Wei; Meneghini, Matteo; Meneghesso, Gaudenzio; Zanoni, Enrico; Singh, Rajendra; Wu, Tian-Li
Journal:: Microelectronics and reliability
Issue:: Volume 100/101(2019)
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Record Type:: Journal Article
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4. Investigation of the passivation-induced VTH shift in p-GaN HEMTs with Au-free gate-first process. (July 2021)

Authors:: Tang, Shun-Wei; Huang, Zhen-Hong; Chen, Yi-Cheng; Wu, Cheng-Hung; Lin, Pin-Hau; Chen, Zheng-Chen; Lu, Ming-Hao; Kao, Kuo-Hsing; Wu, Tian-Li
Journal:: Microelectronics and reliability
Issue:: Volume 122(2021)
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Record Type:: Journal Article
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5. Process improvement of p-GaN HEMTs with a u-GaN etching buffer layer inserted. (1st November 2022)

Authors:: Chang, Chih-Yao; Shen, Yao-Luen; Tang, Shun-Wei; Wu, Tian-Li; Kuo, Wei-Hung; Lin, Suh-Fang; Wu, Yuh-Renn; Huang, Chih-Fang
Journal:: Applied physics express
Issue:: Volume 15:Number 11(2022)
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Record Type:: Journal Article
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6. Stability of wireless power transfer using gamma-ray irradiated GaN power HEMTs. (November 2021)

Authors:: Tang, Shun-Wei; Yao, Pei-Yu; Chao, Der-Sheng; Wu, Tian-Li; Hsu, Heng-Ming
Journal:: Microelectronics and reliability
Issue:: Volume 126(2021)
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Record Type:: Journal Article
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