1. Cross-sectional nanoprobing sample preparation on sub-micron device with fast laser grooving technique. (September 2018) Authors: Tan, P.K.; Zhao, Y.Z.; Rivai, F.; Liu, B.H.; Pan, Y.L.; He, R.; Tan, H.; Mai, Z.H. Journal: Microelectronics and reliability Issue: Volume 88/90(2018) Page Start: 309 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. Failure analysis on 14 nm FinFET devices with ESD CDM failure. (September 2018) Authors: Shaalini, C.; Tan, P.K.; Zhao, Y.Z.; Liu, B.H.; Ma, Y.Z.; Quah, A.; Pan, Y.L.; Tan, H.; Mai, Z.H. Journal: Microelectronics and reliability Issue: Volume 88/90(2018) Page Start: 321 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
3. Solving 28 nm I/O circuit reliability issue due to IC design weakness. (September 2018) Authors: Low, Yi Chao; Tan, P.K.; Tan, S.L.; Zhao, Y.Z.; Lam, J. Journal: Microelectronics and reliability Issue: Volume 88/90(2018) Page Start: 246 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
4. Application of laser deprocessing technique in PFA on chemical over-etched on bond-pad issue. (September 2016) Authors: Yap, H.H.; Tan, P.K.; Zhu, L.; Feng, H.; Zhao, Y.Z.; He, R.; Tan, H.; Liu, B.; Huang, Y.M.; Wang, D.D.; Lam, J.; Mai, Z.H. Journal: Microelectronics and reliability Issue: Volume 64(2016) Page Start: 357 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
5. Cross-sectional nanoprobing fault isolation technique on submicron devices. (September 2016) Authors: Tan, P.K.; Yap, H.H.; Chen, C.Q.; Rivai, F.; Zhao, Y.Z.; Zhu, L.; Feng, H.; Tan, H.; He, R.; Wang, D.D.; Huang, Y.M.; Ma, Y.Z.; Lam, J.; Mai, Z.H. Journal: Microelectronics and reliability Issue: Volume 64(2016) Page Start: 321 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
6. Application of Fast Laser Deprocessing Techniques on large cross-sectional view area sample with FIB-SEM dual beam system. (September 2016) Authors: Zhao, Y.Z.; Wang, Q.J.; Tan, P.K.; Yap, H.H.; Liu, B.H.; Feng, H.; Tan, H.; He, R.; Huang, Y.M.; Wang, D.D.; Zhu, L.; Chen, C.Q.; Rivai, F.; Lam, J.; Mai, Z.H. Journal: Microelectronics and reliability Issue: Volume 64(2016) Page Start: 362 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
7. FRI0311 Coevolution of a URIC Acid Transporter and Uricase: Implications for Gout. (9th June 2015) Authors: Tan, P.K.; Gaucher, E.A.; Miner, J.N. Journal: Annals of the rheumatic diseases Issue: Volume 74(2015)Supplement 2 Page Start: 537 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
8. Top-down delayering to expose large inspection area on die side-edge with Platinum (Pt) deposition technique. Issue 9 (August 2015) Authors: Yap, H.H.; Tan, P.K.; Low, G.R.; Dawood, M.K.; Feng, H.; Zhao, Y.Z.; He, R.; Tan, H.; Zhu, J.; Liu, B.; Huang, Y.M.; Wang, D.D.; Lam, J.; Mai, Z.H. Journal: Microelectronics and reliability Issue: Volume 55:Issue 9/10(2015) Page Start: 1611 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
9. SAT0521 Lesinurad, an Inhibitor of the Uric Acid Transporter URAT1 and A Potential Therapy for Gout, Requires URAT1 Phenylalanine 365 for High Affinity Inhibition. (10th June 2014) Authors: Tan, P.K.; Hyndman, D.; Miner, J.N. Journal: Annals of the rheumatic diseases Issue: Volume 73:Supplement 2(2014) Page Start: 780 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
10. Localization of NVM Inter-Poly Defects using nanoprobing techniques. (May 2021) Authors: Ng, P.T.; Rivai, F.; Quah, A.C.T.; Tan, P.K.; Ting, S.L.; Menon, K. Journal: Microelectronics and reliability Issue: Volume 120(2021) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗