1. RF and broadband noise investigation in High‐k/Metal Gate 28‐nm CMOS bulk transistor‡. (6th January 2014) Authors: Danneville, F.; Poulain, L.; Tagro, Y.; Lepilliet, S.; Dormieu, B.; Gloria, D.; Scheer, P.; Dambrine, G.; Crupi, Giovanni; Schreurs, Dominique; Caddemi, Alina Journal: International journal of numerical modelling Issue: Volume 27:Number 5/6(2014) Page Start: 736 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗