1. Analyzing the interface trap density in SiGe capacitors using an abnormal flat band voltage shift at low temperature. (5th November 2020) Authors: Sun, Li-Chuan; Lin, Chih-Yang; Chen, Po-Hsun; Tsai, Tsung-Ming; Zhou, Kuan-Ju; Tu, Yu-Fa; Huang, Wei-Chen; Tseng, Yi-Ting; Tan, Yung-Fang; Lin, Shih-Kai; Lin, Chun-Chu; Hung, Wei-Chun; Chang, Yen-Cheng; Chang, Ting-Chang Journal: Applied physics express Issue: Volume 13:Number 11(2020) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗