1. Applications of a pnCCD detector coupled to columnar structure CsI(Tl) scintillator system in ultra high energy X-ray Laue diffraction. (20th December 2017) Authors: Shokr, M.; Schlosser, D.; Abboud, A.; Algashi, A.; Tosson, A.; Conka, T.; Hartmann, R.; Klaus, M.; Genzel, C.; Strüder, L.; Pietsch, U. Journal: Journal of instrumentation Issue: Volume 12:Number 12(2017:Dec.) Page Start: P12032 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. Direct measurement of the position accuracy for low energy X-ray photons with a pnCCD. (6th February 2017) Authors: Ihle, S.; Holl, P.; Kalok, D.; Hartmann, R.; Ryll, H.; Steigenhöfer, D.; Strüder, L. Journal: Journal of instrumentation Issue: Volume 12:Number 2(2017:Feb.) Page Start: P02005 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
3. Electron Image Reconstruction for Pixelated Semiconductor Tracking Detectors Based on Neural Networks. (August 2022) Authors: Eckert, B.; Aschauer, S.; Hedley, E.; Huth, M.; Majewski, P.; Strüder, L. Journal: Microscopy and microanalysis Issue: Volume 28(2022)Supplement 1 Page Start: 3040 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
4. Energy‐dispersive X‐ray micro Laue diffraction on a bent gold nanowire. Issue 1 (17th December 2020) Authors: AlHassan, Ali; Abboud, A.; Cornelius, T. W.; Ren, Z.; Thomas, O.; Richter, G.; Micha, J.-S.; Send, S.; Hartmann, R.; Strüder, L.; Pietsch, U. Journal: Journal of applied crystallography Issue: Volume 54:Issue 1(2021) Page Start: 80 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
5. Examples of XRF and PIXE imaging with few microns resolution using SLcam® a color X‐ray camera1. (19th February 2015) Authors: Nowak, S. H.; Bjeoumikhov, A.; von Borany, J.; Buchriegler, J.; Munnik, F.; Petric, M.; Renno, A. D.; Radtke, M.; Reinholz, U.; Scharf, O.; Strüder, L.; Wedell, R.; Ziegenrücker, R. Journal: X-ray spectrometry Issue: Volume 44:Number 3(2015) Page Start: 135 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
6. High Speed, High Resolution pnCCDs as Two Dimensional Imaging Spectrometers for X-rays and Electrons. (August 2014) Authors: Soltau, H.; Hartmann, R.; Holl, P.; Ihle, S.; Ryll, H.; Huth, M.; Schmidt, J.; Eckhardt, R.; Simson, M.; Soltau, J.; Thamm, Ch.; Strüder, L. Journal: Microscopy and microanalysis Issue: Volume 20(2014)Supplement 3 Page Start: 652 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
7. High Speed, High Resolution pnCCDs as Two Dimensional Imaging Spectrometers for X-rays and Electrons. (August 2014) Authors: Soltau, H.; Hartmann, R.; Holl, P.; Ihle, S.; Ryll, H.; Huth, M.; Schmidt, J.; Eckhardt, R.; Simson, M.; Soltau, J.; Thamm, Ch.; Strüder, L. Journal: Microscopy and microanalysis Issue: Volume 20:Number 3(2014:Jun.) Page Start: 652 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
8. High Speed, High Throughput Two Dimensional Direct Electron Detector Based on the Concept of pnCCDs. (August 2014) Authors: Strüder, L.; Soltau, J.; Schmidt, J.; Hartmann, R.; Huth, M.; Soltau, H.; Holl, P.; Simson, M.; Lutz, G.; Ryll, H. Journal: Microscopy and microanalysis Issue: Volume 20(2014)Supplement 3 Page Start: 392 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
9. High Speed, High Throughput Two Dimensional Direct Electron Detector Based on the Concept of pnCCDs. (August 2014) Authors: Strüder, L.; Soltau, J.; Schmidt, J.; Hartmann, R.; Huth, M.; Soltau, H.; Holl, P.; Simson, M.; Lutz, G.; Ryll, H. Journal: Microscopy and microanalysis Issue: Volume 20:Number 3(2014:Jun.) Page Start: 392 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
10. Large Solid Angle Silicon Drift Detectors for EDX Analysis in TEM. (August 2014) Authors: Niculae, A.; Bornschlegl, M.; Eckhardt, R.; Herrmann, J.; Jeschke, S.; Krenz, G.; Liebel, A.; Lutz, G.; Soltau, H.; Strüder, L. Journal: Microscopy and microanalysis Issue: Volume 20(2014)Supplement 3 Page Start: 1124 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗