1. Kinetics of catastrophic optical damage in GaN-based diode lasers. (9th June 2015) Authors: Hempel, Martin; Tomm, Jens W; Stojetz, Bernhard; König, Harald; Strauss, Uwe; Elsaesser, Thomas Journal: Semiconductor science and technology Issue: Volume 30:Number 7(2015:Jul.) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗