Author/Creator: Stockman, A. - British Library Electronic Legal Deposit Catalogue-Journal Issues and Articles Search Results

Author/Creator Stockman, A.

1. A retrospective analysis omalizumab treatment patterns in patients with chronic spontaneous urticaria: a real‐world study in Belgium. (19th August 2019)

Authors:: Lapeere, H.; Baeck, M.; Stockman, A.; Sabato, V.; Grosber, M.; Moutschen, M.; Lambert, J.; Vandebuerie, L.; de Montjoye, L.; Rabijns, H.; Allewaert, K.; Schrijvers, R.
Journal:: Journal of the European Academy of Dermatology and Venereology
Issue:: Volume 34:Number 1(2020)
Page Start:: 127
Record Type:: Journal Article
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2. Dermo‐cosmetic spray containing Rhealba oat plantlets and Uncaria tomentosa extract in patients with mild‐to‐moderate cutaneous pain. (16th February 2022)

Authors:: Stockman, A.; Belpaire, A.; Hadshiew, I.M.; Žemličkova, M.; Vergou, T.; Navarro Triviño, F.; Márquez García, A.; Vasco, M.; Vazharova, B.K.; Carballido, F.
Journal:: Journal of the European Academy of Dermatology and Venereology
Issue:: Volume 36:Number 4(2022)Supplement
Page Start:: 3
Record Type:: Journal Article
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3. ESD-failure of E-mode GaN HEMTs: Role of device geometry and charge trapping. (September 2019)

Authors:: Canato, E.; Meneghini, M.; Nardo, A.; Masin, F.; Barbato, A.; Barbato, M.; Stockman, A.; Banerjee, A.; Moens, P.; Zanoni, E.; Meneghesso, G.
Journal:: Microelectronics and reliability
Issue:: Volume 100/101(2019)
Page Start:
Record Type:: Journal Article
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4. Impact of sidewall etching on the dynamic performance of GaN-on-Si E-mode transistors. (September 2018)

Authors:: Tajalli, A.; Canato, E.; Nardo, A.; Meneghini, M.; Stockman, A.; Moens, P.; Zanoni, E.; Meneghesso, G.
Journal:: Microelectronics and reliability
Issue:: Volume 88/90(2018)
Page Start:: 572
Record Type:: Journal Article
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5. OFF-state trapping phenomena in GaN HEMTs: Interplay between gate trapping, acceptor ionization and positive charge redistribution. (November 2020)

Authors:: Canato, E.; Meneghini, M.; De Santi, C.; Masin, F.; Stockman, A.; Moens, P.; Zanoni, E.; Meneghesso, G.
Journal:: Microelectronics and reliability
Issue:: Volume 114(2020)
Page Start:
Record Type:: Journal Article
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