1. A review of pulsed NBTI in P-channel power VDMOSFETs. (March 2018) Authors: Danković, D.; Manić, I.; Prijić, A.; Davidović, V.; Prijić, Z.; Golubović, S.; Djorić-Veljković, S.; Paskaleva, A.; Spassov, D.; Stojadinović, N. Journal: Microelectronics and reliability Issue: Volume 82(2018) Page Start: 28 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. Inter-trap tunneling in vanadium doped TiO2 sol-gel films. (July 2020) Authors: Simeonov, S.; Szekeres, A.; Covei, M.; Spassov, D.; Kitin, G.; Predoana, L.; Calderon-Moreno, J.M.; Nicolescu, M.; Preda, S.; Stroescu, H.; Gartner, M.; Zaharescu, M. Journal: Materials research bulletin Issue: Volume 127(2020) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
3. Model based precise analysis of the injection currents in Al/ZrO2/Al2O3/ZrO2/SiO2/Si structures for use in charge trapping non-volatile memory devices. (15th March 2016) Authors: Novkovski, N.; Paskaleva, A.; Skeparovski, A.; Spassov, D. Journal: Materials science in semiconductor processing Issue: Volume 44(2016:Mar.) Page Start: 30 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗