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2. A Comparison of Surface Passivation Techniques for Measurement of Minority Carrier Lifetime in Thin Si Wafers: Toward a Stable and Uniform Passivation. Issue 1670 (17th June 2014)

3. Defects in Epitaxial lift-off Thin Si Films/Wafers and Their Influence on the Solar Cell Performance. Issue 1666 (3rd November 2014)