1. A dummy cell added neural network using in pattern recognition for prevention of failed events. (October 2017) Authors: Li, Cheng; Song, Yun-Heub Journal: Microelectronics journal Issue: Volume 68(2017) Page Start: 23 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. Effect of oxygen stoichiometry on the threshold switching of RF-sputtered NbOx (x = 2.0–2.5) films. (December 2021) Authors: Aziz, Jamal; Kim, Honggyun; Rehman, Shania; Hur, Ji-Hyun; Song, Yun-Heub; Khan, Muhammad Farooq; Kim, Deok-kee Journal: Materials research bulletin Issue: Volume 144(2021) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
3. Impact of etch angles on cell characteristics in 3D NAND flash memory. (September 2018) Authors: Oh, Young-Taek; Kim, Kyu-Beom; Shin, Sang-Hoon; Sim, Hahng; Van Toan, Nguyen; Ono, Takahito; Song, Yun-Heub Journal: Microelectronics journal Issue: Volume 79(2018) Page Start: 1 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
4. Influence of Thomson effect on amorphization in phase-change memory: dimensional analysis based on Buckingham's П theorem for Ge2Sb2Te5. (24th November 2021) Authors: Yamamoto, Takuya; Hatayama, Shogo; Song, Yun-Heub; Sutou, Yuji Journal: Materials research express Issue: Volume 8:Number 11(2021) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
5. Low resistance-drift characteristics in Cr2Ge2Te6-based phase change memory devices with a high-resistance crystalline phase. (October 2021) Authors: Hatayama, Shogo; Song, Yun-Heub; Sutou, Yuji Journal: Materials science in semiconductor processing Issue: Volume 133(2021) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
6. TDDB modeling depending on interfacial conditions in magnetic tunnel junctions. (6th September 2017) Authors: Choi, Chul-Min; Sukegawa, Hiroaki; Mitani, Seiji; Song, Yun-Heub Journal: Semiconductor science and technology Issue: Volume 32:Number 10(2017:Oct.) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
7. Temperature dependence of reliability characteristics for magnetic tunnel junctions with a thin MgO dielectric film. (9th June 2016) Authors: Choi, Chul-Min; Oh, Young-Taek; Kim, Kyung-Jun; Park, Jin-Suk; Sukegawa, Hiroaki; Mitani, Seiji; Kim, Sung-Kyu; Lee, Jeong-Yong; Song, Yun-Heub Journal: Semiconductor science and technology Issue: Volume 31:Number 7(2016:Jul.) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗