1. Advances in source technology for focused ion beam instruments. (9th April 2014) Authors: Smith, Noel S.; Notte, John A.; Steele, Adam V. Journal: MRS bulletin Issue: Volume 39:Number 4(2014:Apr.) Page Start: 329 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. Advances in source technology for focused ion beam instruments. (9th April 2014) Authors: Smith, Noel S.; Notte, John A.; Steele, Adam V. Journal: MRS bulletin Issue: Volume 39:Number 4(2014:Apr.) Page Start: 329 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
3. Ex situ Lift Out of PFIB Prepared TEM Specimens. (August 2014) Authors: Giannuzzi, Lucille A.; Smith, Noel S. Journal: Microscopy and microanalysis Issue: Volume 20(2014)Supplement 3 Page Start: 340 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
4. Ex situ Lift Out of PFIB Prepared TEM Specimens. (August 2014) Authors: Giannuzzi, Lucille A.; Smith, Noel S. Journal: Microscopy and microanalysis Issue: Volume 20:Number 3(2014:Jun.) Page Start: 340 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
5. Theory and New Applications of Ex Situ Lift Out. (16th July 2015) Authors: Giannuzzi, Lucille A.; Yu, Zhiyang; Yin, Denise; Harmer, Martin P.; Xu, Qiang; Smith, Noel S.; Chan, Lisa; Hiller, Jon; Hess, Dustin; Clark, Trevor Journal: Microscopy and microanalysis Issue: Volume 21:Number 4(2015:Aug.) Page Start: 1034 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗