1. Nickel oxide interlayer films from nickel formate–ethylenediamine precursor: influence of annealing on thin film properties and photovoltaic device performance1. Issue 20 (28th May 2015) Authors: Steirer, K. X.; Richards, R. E.; Sigdel, A. K.; Garcia, A.; Ndione, P. F.; Hammond, S.; Baker, D.; Ratcliff, E. L.; Curtis, C.; Furtak, T.; Ginley, D. S.; Olson, D. C.; Armstrong, N. R.; Berry, J. J. Journal: Journal of materials chemistry Issue: Volume 3:Issue 20(2015) Page Start: 10949 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗