Nickel oxide interlayer films from nickel formate–ethylenediamine precursor: influence of annealing on thin film properties and photovoltaic device performance1. Issue 20 (28th May 2015)

• Record Type: Journal Article
• Authors: Steirer, K. X.; Richards, R. E.; Sigdel, A. K.; Garcia, A.; Ndione, P. F.; Hammond, S.; Baker, D.; Ratcliff, E. L.; Curtis, C.; Furtak, T.; Ginley, D. S.; Olson, D. C.; Armstrong, N. R.; Berry, J. J.
• Is Part Of: Journal of materials chemistry. Volume 3:Issue 20(2015)
• Page Start: 10949
• Page End: 10958
• Publication Date: 2015-05-28
• Subjects: Materials -- Research -- Periodicals; Chemistry, Analytic -- Periodicals; Environmental sciences -- Research -- Periodicals; 543.0284
• DOI: 10.1039/c5ta01379h
• Languages: English
• ISSNs: 2050-7488

Abstract

<abstract abstract-type="toc"> <title> <x xml:space="preserve">Abstract</x> </title> <p> <graphic position="anchor" id="ga" xlink:href="ark:/27927/pgjn3198xk" xlink:type="simple" xmlns:xlink="http://www.w3.org/1999/xlink" />Decomposition/oxidation correlated to nanoscale c-AFM helps separate selectivity and conductivity.</p> </abstract>