1. Mapping of Au/a‐IGZO Schottky contacts by using scanning internal photoemission microscopy. Issue 2 (5th December 2016) Authors: Shiojima, Kenji; Shingo, Masato Journal: Physica status solidi Issue: Volume 254:Issue 2(2017) Page Start: n/a Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. Mapping of Si/SiC p–n heterojunctions using scanning internal photoemission microscopy. (9th March 2016) Authors: Shingo, Masato; Liang, Jianbo; Shigekawa, Naoteru; Arai, Manabu; Shiojima, Kenji Journal: Japanese journal of applied physics Issue: Volume 55:Number 4(2016:Apr.)Supplement 4 Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
3. Two-dimensional characterization of 3C-SiC layers using scanning internal photoemission microscopy: Mapping of electrical characteristics and crystal quality in domain boundary regions. (16th February 2017) Authors: Shiojima, Kenji; Shingo, Masato; Ichikawa, Naoto; Kato, Masashi Journal: Japanese journal of applied physics Issue: Volume 56:Number 4(2017)Supplement Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗