1. Atom probe tomographic assessment of the distribution of germanium atoms implanted in a silicon matrix through nano-apertures. (31st August 2017) Authors: Tu, Y; Han, B; Shimizu, Y; Inoue, K; Fukui, Y; Yano, M; Tanii, T; Shinada, T; Nagai, Y Journal: Nanotechnology Issue: Volume 28:Number 38(2017) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗