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Author/Creator Shields, P.

1. Electron Channeling Contrast Imaging of Defects in III-Nitride Semiconductors. (August 2014)

Authors:
Trager-Cowan, C.; Naresh-Kumar, G.; Allehiani, N.; Kraeusel, S.; Hourahine, B.; Vespucci, S.; Thomson, D.; Bruckbauer, J.; Kusch, G.; Edwards, P. R.; Martin, R. W.; Mauder, C.; Day, A. P.; Winkelmann, A.; Vilalta-Clemente, A.; Wilkinson, A. J.; Parbrook, P. J.; Kappers, M. J.; Moram, M. A.; Olive...
Journal:
Microscopy and microanalysis
Issue:
Volume 20(2014)Supplement 3
Page Start:
1024
Record Type:
Journal Article
View Content:
Available online (eLD content is only available in our Reading Rooms) ↗

2. Electron Channeling Contrast Imaging of Defects in III-Nitride Semiconductors. (August 2014)

Authors:
Trager-Cowan, C.; Naresh-Kumar, G.; Allehiani, N.; Kraeusel, S.; Hourahine, B.; Vespucci, S.; Thomson, D.; Bruckbauer, J.; Kusch, G.; Edwards, P. R.; Martin, R. W.; Mauder, C.; Day, A. P.; Winkelmann, A.; Vilalta-Clemente, A.; Wilkinson, A. J.; Parbrook, P. J.; Kappers, M. J.; Moram, M. A.; Olive...
Journal:
Microscopy and microanalysis
Issue:
Volume 20:Number 3(2014:Jun.)
Page Start:
1024
Record Type:
Journal Article
View Content:
Available online (eLD content is only available in our Reading Rooms) ↗