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You searched for: Author/Creator Shi, YanLingLimit your search
- Shi, YanLing [remove] 2
- 621.3815 2
- Appareils électroniques -- Fiabilité -- Périodiques 2
- Electronic apparatus and appliances -- Reliability 2
- Electronic apparatus and appliances -- Reliability -- Periodicals 2
- Miniature electronic equipment 2
- Miniature electronic equipment -- Periodicals 2
- Periodicals 2
- Équipement électronique miniaturisé -- Périodiques 2
- Negative bias temperature instability (NBTI) -- Long-term recovery -- Reaction–diffusion (RD) -- Locking effect -- Slowing diffusivity 1
- Negative bias temperature instability (NBTI) -- Reaction-diffusion (R-D) model -- Trapping/detrapping (T/D) model -- Parameter extraction -- Genetic algorithm -- Coordinate system conversion 1