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3. Depletion of superjunction power MOSFETs visualized by electron beam induced current and voltage contrast measurements. Issue 11 (8th August 2014)

4. Electrically detected magnetic resonance study on defects in Si pn‐junctions created by proton implantation. Issue 11 (8th August 2014)

5. High dose proton implantations into silicon: a combined EBIC, SRP and TEM study. Issue 11 (8th August 2014)