1. A Novel High-temperature Aircraft-specific Energy Harvester Using PCMs and State of the art TEGs. (2015) Authors: Elefsiniotis, A.; Kokorakis, N.; Becker, Th.; Schmid, U. Journal: Materials today Issue: Volume 2:Number 2(2015) Page Start: 814 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. A Novel Miniaturised Sensor for Combined Static and Dynamic Pressure Measurements in Harsh Environments. (2016) Authors: Zarfl, C.; Schmid, P.; Schmid, U. Journal: Procedia engineering Issue: Volume 168(2016) Page Start: 782 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
3. A numerical method to determine the displacement spectrum of micro-plates in viscous fluids. (February 2022) Authors: Gesing, A.; Platz, D.; Schmid, U. Journal: Computers & structures Issue: Volume 260(2022) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
4. Flexoelectricity in polycrystalline TiO2 thin films. (15th May 2020) Authors: Maier, F.J.; Schneider, M.; Schrattenholzer, J.; Artner, W.; Hradil, K.; Artemenko, A.; Kromka, A.; Schmid, U. Journal: Acta materialia Issue: Volume 190(2020) Page Start: 124 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
5. Fracture Analysis of a-SiC:H Membranes after Thermal Annealing. (2016) Authors: Frischmuth, T.; Klein, A.; Schneider, M.; Grille, T.; Schmid, U. Journal: Procedia engineering Issue: Volume 168(2016) Page Start: 1164 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
6. Growth and characterization of low pressure chemical vapor deposited Si on Si-face 4H–SiC. (15th August 2021) Authors: Triendl, F.; Pfusterschmied, G.; Pobegen, G.; Schwarz, S.; Artner, W.; Konrath, J.P.; Schmid, U. Journal: Materials science in semiconductor processing Issue: Volume 131(2021) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
7. Impact of Ar+ bombardment of 4H–SiC substrates on Schottky diode barrier heights. (1st March 2021) Authors: Pfusterschmied, G.; Triendl, F.; Schneider, M.; Schmid, U. Journal: Materials science in semiconductor processing Issue: Volume 123(2021) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
8. Influence of metallic catalyst and doping level on the metal assisted chemical etching of silicon. (15th March 2016) Authors: Backes, A.; Bittner, A.; Leitgeb, M.; Schmid, U. Journal: Scripta materialia Issue: Volume 114(2016) Page Start: 27 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
9. Investigation on Different Damping Mechanisms on the Q Factor of MEMS Resonators. (2016) Authors: Jandak, M.; Neuzil, T.; Schneider, M.; Schmid, U. Journal: Procedia engineering Issue: Volume 168(2016) Page Start: 929 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
10. Microstructure and piezoelectric response of YxAl1−xN thin films. (November 2015) Authors: Mayrhofer, P.M.; Riedl, H.; Euchner, H.; Stöger-Pollach, M.; Mayrhofer, P.H.; Bittner, A.; Schmid, U. Journal: Acta materialia Issue: Volume 100(2015) Page Start: 81 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗