1. Lattice strain and tilt mapping in stressed Ge microstructures using X‐ray Laue micro‐diffraction and rainbow filtering. Issue 5 (4th August 2016) Authors: Tardif, Samuel; Gassenq, Alban; Guilloy, Kevin; Pauc, Nicolas; Osvaldo Dias, Guilherme; Hartmann, Jean-Michel; Widiez, Julie; Zabel, Thomas; Marin, Esteban; Sigg, Hans; Faist, Jérôme; Chelnokov, Alexei; Reboud, Vincent; Calvo, Vincent; Micha, Jean-Sébastien; Robach, Odile; Rieutord, François Journal: Journal of applied crystallography Issue: Volume 49:Issue 5(2016) Page Start: 1402 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. LaueNN: neural‐network‐based hkl recognition of Laue spots and its application to polycrystalline materials. Issue 4 (15th June 2022) Authors: Purushottam Raj Purohit, Ravi Raj Purohit; Tardif, Samuel; Castelnau, Olivier; Eymery, Joel; Guinebretière, René; Robach, Odile; Ors, Taylan; Micha, Jean-Sébastien Journal: Journal of applied crystallography Issue: Volume 55:Issue 4(2022) Page Start: 737 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
3. In‐situ force measurement during nano‐indentation combined with Laue microdiffraction. Issue 1 (21st October 2020) Authors: Lauraux, Florian; Yehya, Sarah; Labat, Stéphane; Micha, Jean‐Sébastien; Robach, Odile; Kovalenko, Oleg; Rabkin, Eugen; Thomas, Olivier; Cornelius, Thomas W. Journal: Nano select Issue: Volume 2:Issue 1(2021) Page Start: 99 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
4. In-situ X-ray μLaue diffraction study of copper through-silicon vias. (January 2016) Authors: Sanchez, Dario Ferreira; Reboh, Shay; Weleguela, Monica Larissa Djomeni; Micha, Jean-Sébastien; Robach, Odile; Mourier, Thierry; Gergaud, Patrice; Bleuet, Pierre Journal: Microelectronics and reliability Issue: Volume 56(2016) Page Start: 78 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
5. Analysis of the full stress tensor in a micropillar: Ability of and difficulties arising during synchrotron based μLaue diffraction. (15th October 2016) Authors: Davydok, Anton; Jaya, Balila Nagamani; Robach, Odile; Ulrich, Olivier; Micha, Jean-Sébastien; Kirchlechner, Christoph Journal: Materials & design Issue: Volume 108(2016) Page Start: 68 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
6. In-situ X-ray μLaue diffraction study of copper through-silicon vias. (January 2016) Authors: Sanchez, Dario Ferreira; Reboh, Shay; Weleguela, Monica Larissa Djomeni; Micha, Jean-Sébastien; Robach, Odile; Mourier, Thierry; Gergaud, Patrice; Bleuet, Pierre Journal: Microelectronics and reliability Issue: Volume 56(2016) Page Start: 78 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
7. Analysis of the full stress tensor in a micropillar: Ability of and difficulties arising during synchrotron based μLaue diffraction. (15th October 2016) Authors: Davydok, Anton; Jaya, Balila Nagamani; Robach, Odile; Ulrich, Olivier; Micha, Jean-Sébastien; Kirchlechner, Christoph Journal: Materials & design Issue: Volume 108(2016) Page Start: 68 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
8. Evidence of 3D strain gradients associated with tin whisker growth. (February 2018) Authors: Hektor, Johan; Marijon, Jean-Baptiste; Ristinmaa, Matti; Hall, Stephen A.; Hallberg, Håkan; Iyengar, Srinivasan; Micha, Jean-Sébastien; Robach, Odile; Grennerat, Fanny; Castelnau, Olivier Journal: Scripta materialia Issue: Number 144(2018) Page Start: 1 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
9. Full elastic strain tensor determination at the phase scale in a powder metallurgy nickel‐based superalloy using X‐ray Laue microdiffraction. Issue 6 (20th November 2017) Authors: Altinkurt, Gader; Fèvre, Mathieu; Robach, Odile; Micha, Jean-Sébastien; Geandier, Guillaume; Dehmas, Moukrane Journal: Journal of applied crystallography Issue: Volume 50:Issue 6(2017) Page Start: 1754 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
10. A tunable multicolour `rainbow' filter for improved stress and dislocation density field mapping in polycrystals using X‐ray Laue microdiffraction. (6th February 2013) Authors: Robach, Odile; Micha, Jean‐Sébastien; Ulrich, Olivier; Geaymond, Olivier; Sicardy, Olivier; Härtwig, Jürgen; Rieutord, François Journal: Acta crystallographica Issue: Volume 69:Part 2(2013:Mar.) Page Start: 164 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗