1. Advances in Beam-sensitive Sample Preparation and Observation. (August 2022) Authors: Nowakowski, Pawel; Bonifacio, Cecile; Ray, Mary; Fischione, Paul Journal: Microscopy and microanalysis Issue: Volume 28(2022)Supplement 1 Page Start: 2214 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. Advances in Large-area Sample Preparation Using Broad Argon Ion Beam Milling for Multiphase Materials. (August 2020) Authors: Nowakowski, Pawel; Ray, Mary; Fischione, Paul Journal: Microscopy and microanalysis Issue: Volume 26:(2020)Supplement 2 Page Start: 1982 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
3. Alternative Post-FIB Polishing Using Low-Energy Argon Ion Milling to Prevent Grid Redeposition. (August 2021) Authors: Bonifacio, Cecile; Nowakowski, Pawel; Ray, Mary; Fischione, Paul Journal: Microscopy and microanalysis Issue: Volume 27:Supplement 1(2021) Page Start: 426 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
4. Combining Emerging Sample Preparation Methods, SEM, and TEM Investigations for Microelectronics Device Characterization at Multiple Scales. (August 2019) Authors: Nowakowski, Pawel; Bonifacio, Cecile; Ray, Mary; Fischione, Paul Journal: Microscopy and microanalysis Issue: Volume 25:(2022)Supplement 2 Page Start: 688 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
5. Developments in controlled environmental transfer for Li-based battery materials: From sample preparation to SEM investigation. (August 2021) Authors: Nowakowski, Pawel; Bonifacio, Cecile; Ray, Mary; Fischione, Paul Journal: Microscopy and microanalysis Issue: Volume 27:Supplement 1(2021) Page Start: 1844 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
6. Developments in sample preparation of advanced semiconductor devices from the bulk to nanometer-length scales. (August 2021) Authors: Bonifacio, Cecile; Downing, Clive; Nowakowski, Pawel; Li, Richard; Ray, Mary; Fischione, Paul Journal: Microscopy and microanalysis Issue: Volume 27:Supplement 1(2021) Page Start: 1078 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
7. Elastic and Plastic Strain Measurement Using Electron Backscatter Diffraction Technique: The Influence of Sample Preparation. (August 2019) Authors: Nowakowski, Pawel; Wiezorek, Jorg; Spinelli, Ian; Ray, Mary; Fischione, Paul Journal: Microscopy and microanalysis Issue: Volume 25:(2022)Supplement 2 Page Start: 534 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
8. Mechanisms of Cracking in Pure Magnesium During High Strain Rate Plastic Deformation. (August 2022) Authors: Nowakowski, Pawel; Ray, Mary; Fischione, Paul Journal: Microscopy and microanalysis Issue: Volume 28(2022)Supplement 1 Page Start: 1814 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
9. Metrology of Sample Preparation for Electron Microscopy: Application to Strain Measurements. (August 2022) Authors: Nowakowski, Pawel; Ray, Mary; Fischione, Paul Journal: Microscopy and microanalysis Issue: Volume 28(2022)Supplement 1 Page Start: 768 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
10. Millimeter-scale, Large Uniform Area Semiconductor Device Delayering for Physical Failure Analyses and Quality Control. (August 2022) Authors: Nowakowski, Pawel; Ray, Mary; Fischione, Paul Journal: Microscopy and microanalysis Issue: Volume 28(2022)Supplement 1 Page Start: 3184 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗