1. Atom-by-Atom STEM Investigation of Defect Engineering in Graphene. (August 2014) Authors: Ramasse, Q.M.; Kepapstoglou, D.M.; Hage, F.S.; Susi, T.; Kotakoski, J.; Mangler, C.; Ayala, P.; Meyer, J.; Hinks, J.A.; Donnelly, S.; Zan, R.; Pan, C.T.; Haigh, S.J.; Bangert, U. Journal: Microscopy and microanalysis Issue: Volume 20(2014)Supplement 3 Page Start: 1736 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. Atom-by-Atom STEM Investigation of Defect Engineering in Graphene. (August 2014) Authors: Ramasse, Q.M.; Kepapstoglou, D.M.; Hage, F.S.; Susi, T.; Kotakoski, J.; Mangler, C.; Ayala, P.; Meyer, J.; Hinks, J.A.; Donnelly, S.; Zan, R.; Pan, C.T.; Haigh, S.J.; Bangert, U. Journal: Microscopy and microanalysis Issue: Volume 20:Number 3(2014:Jun.) Page Start: 1736 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
3. Atomic study of Fe3O4/SrTiO3 Interface. (23rd September 2015) Authors: Gilks, D.; Kepaptsoglou, D.M.; McKenna, K.; Lari, L.; Ramasse, Q.M.; Matsuzaki, K.; Susaki, T.; Lazarov, V.K. Journal: Microscopy and microanalysis Issue: Volume 21(2015:Jun.)Supplement 3 Page Start: 1299 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
4. Atomic study of Fe3O4/SrTiO3 Interface. (August 2015) Authors: Gilks, D.; Kepaptsoglou, D.M.; McKenna, K.; Lari, L.; Ramasse, Q.M.; Matsuzaki, K.; Susaki, T.; Lazarov, V.K. Journal: Microscopy and microanalysis Issue: Volume 21(2015:Jun.)Supplement 3 Page Start: 1299 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
5. Atomic-Scale STEM-EELS Characterization of the Chemistry of Structural Defects and Interfaces in Energy-Related Materials. (August 2014) Authors: Ramasse, Q.M.; Azough, F.; Freer, R.; Kepaptsoglou, D.M.; Mainz, R.; Weber, A.; Abou-Ras, D.; Simsek, E.; van Aken, P.A. Journal: Microscopy and microanalysis Issue: Volume 20(2014)Supplement 3 Page Start: 562 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
6. Atomic-Scale STEM-EELS Characterization of the Chemistry of Structural Defects and Interfaces in Energy-Related Materials. (August 2014) Authors: Ramasse, Q.M.; Azough, F.; Freer, R.; Kepaptsoglou, D.M.; Mainz, R.; Weber, A.; Abou-Ras, D.; Simsek, E.; van Aken, P.A. Journal: Microscopy and microanalysis Issue: Volume 20:Number 3(2014:Jun.) Page Start: 562 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
7. Crystal Structure, Cation Occupancy and Vacancy Ordering in Thermoelectric (1-x)SrTiO3-xLa1/3NbO3: A STEM-EELS Study. (August 2014) Authors: Azough, F.; Kepaptsoglou, D.M; Srivastava, D.; Ramasse, Q.M.; Freer, R. Journal: Microscopy and microanalysis Issue: Volume 20(2014)Supplement 3 Page Start: 1958 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
8. Crystal Structure, Cation Occupancy and Vacancy Ordering in Thermoelectric (1-x)SrTiO3-xLa1/3NbO3: A STEM-EELS Study. (August 2014) Authors: Azough, F.; Kepaptsoglou, D.M; Srivastava, D.; Ramasse, Q.M.; Freer, R. Journal: Microscopy and microanalysis Issue: Volume 20:Number 3(2014:Jun.) Page Start: 1958 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
9. Electronic Structure Modification of Boron and Nitrogen Ion-Implanted Graphene Fingerprinted by STEM-EELS. (August 2014) Authors: Kepaptsoglou, D.M.; Seabourne, C.R.; Hardcastle, T.; Nicholls, R.; Pierce, W.; Zan, R.; Bangert, U.; Scott, A.J.; Ramasse, Q.M. Journal: Microscopy and microanalysis Issue: Volume 20(2014)Supplement 3 Page Start: 1734 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
10. Electronic Structure Modification of Boron and Nitrogen Ion-Implanted Graphene Fingerprinted by STEM-EELS. (August 2014) Authors: Kepaptsoglou, D.M.; Seabourne, C.R.; Hardcastle, T.; Nicholls, R.; Pierce, W.; Zan, R.; Bangert, U.; Scott, A.J.; Ramasse, Q.M. Journal: Microscopy and microanalysis Issue: Volume 20:Number 3(2014:Jun.) Page Start: 1734 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗