Author/Creator: Rahimo, Munaf - British Library Electronic Legal Deposit Catalogue-Journal Issues and Articles Search Results

Author/Creator Rahimo, Munaf

1. Future trends in high‐power bipolar metal‐oxide semi‐conductor controlled power semi‐conductors. Issue 3 (1st May 2014)

Authors:: Rahimo, Munaf
Journal:: IET circuits, devices & systems
Issue:: Volume 8:Issue 3(2014)
Page Start:: 155
Record Type:: Journal Article
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2. Reverse blocking IGCT optimised for 1 kV DC bi‐directional solid state circuit breaker. Issue 12 (1st December 2015)

Authors:: Vemulapati, Umamaheswara; Arnold, Martin; Rahimo, Munaf; Antoniazzi, Antonello; Pessina, Davide
Journal:: IET power electronics
Issue:: Volume 8:Issue 12(2015)
Page Start:: 2308
Record Type:: Journal Article
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3. Reverse conducting–IGBTs initial snapback phenomenon and its analytical modelling. Issue 3 (1st May 2014)

Authors:: Vemulapati, Umamaheswara; Kaminski, Nando; Silber, Dieter; Storasta, Liutauras; Rahimo, Munaf
Journal:: IET circuits, devices & systems
Issue:: Volume 8:Issue 3(2014)
Page Start:: 168
Record Type:: Journal Article
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4. Soft‐punch‐through buffer concept for 600–1200 V IGBTs. Issue 15 (3rd October 2019)

Authors:: Andenna, Maxi; Buitrago, Elizabeth; Corvasce, Chiara; Papadopoulos, Charalampos; Jabrany, Rachid; Rahimo, Munaf
Journal:: IET power electronics
Issue:: Volume 12:Issue 15(2019)
Page Start:: 3874
Record Type:: Journal Article
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5. The impact on power semiconductor device operation due to local electric field alterations in the planar junction termination. (March 2016)

Authors:: Rahimo, Munaf; Richter, Frank; Fischer, Fabian; Vemulapati, Umamaheswara; Kopta, Arnost; Corvasce, Chiara; Geissmann, Silvan; Bellini, Marco; Bayer, Martin; Bauer, Friedhelm
Journal:: Microelectronics and reliability
Issue:: Volume 58(2016)
Page Start:: 51
Record Type:: Journal Article
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6. The influence of humidity on the high voltage blocking reliability of power IGBT modules and means of protection. (September 2018)

Authors:: Papadopoulos, Charalampos; Corvasce, Chiara; Kopta, Arnost; Schneider, Daniel; Pâques, Gontran; Rahimo, Munaf
Journal:: Microelectronics and reliability
Issue:: Volume 88/90(2018)
Page Start:: 470
Record Type:: Journal Article
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