1. Conductive filament formation at grain boundary locations in polycrystalline HfO2 -based MIM stacks: Computational and physical insight. (September 2016) Authors: Shubhakar, K.; Mei, S.; Bosman, M.; Raghavan, N.; Ranjan, A.; O'Shea, S.J.; Pey, K.L. Journal: Microelectronics and reliability Issue: Volume 64(2016) Page Start: 204 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. Conductive filament formation at grain boundary locations in polycrystalline HfO2 -based MIM stacks: Computational and physical insight. (September 2016) Authors: Shubhakar, K.; Mei, S.; Bosman, M.; Raghavan, N.; Ranjan, A.; O'Shea, S.J.; Pey, K.L. Journal: Microelectronics and reliability Issue: Volume 64(2016) Page Start: 204 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗