1. Analysis of Thin Film Specimens Using ToF-SIMS Wedge Protocol, A Comparison with Depth Profiling. (August 2021) Authors: Smentkowski, Vincent; Goswami, Shubhodeep; Kollmer, Felix; Zakel, Julia; Arlinghaus, Henrik; Rading, Derk Journal: Microscopy and microanalysis Issue: Volume 27:Supplement 1(2021) Page Start: 1564 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. Dual beam depth profiling of organic materials: assessment of capabilities and limitations. (November 2014) Authors: Niehuis, Ewald; Moellers, Rudolf; Rading, Derk; Bruener, Philipp; Lee, Yeonhee; Moon, DaeWon; Kang, Hee Jae; Kim, Kyung Joong; Lee, Tae Geol; Lee, Jae Cheol; Yi, Keewook; Hong, Tae Eun Journal: Surface and interface analysis Issue: Volume 46:Number 1(2014:Jan.) Page Start: 70 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
3. Low‐temperature plasma for compositional depth profiling of crosslinking organic multilayers: comparison with C60 and giant argon gas cluster sources. (30th September 2014) Authors: Muramoto, Shin; Rading, Derk; Bush, Brian; Gillen, Greg; Castner, David G. Journal: Rapid communications in mass spectrometry Issue: Volume 28:Number 18(2014) Page Start: 1971 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
4. Time-of-Flight Secondary Ion Mass Spectroscopy with Bismuth Primary Ions of Clean and Air-Exposed Surfaces of Tellurium. Issue 6 (December 2014) Authors: Trzyna, Malgorzata; Berchenko, Nicolas; Rading, Derk; Cebulski, Jozef Journal: European journal of mass spectrometry Issue: Volume 20:Issue 6(2014) Page Start: 429 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗