Author/Creator: Rack, Martin - British Library Electronic Legal Deposit Catalogue-Journal Issues and Articles Search Results

Author/Creator Rack, Martin

1. (Invited) SOI Technologies for RF and Millimeter Wave Applications. (3rd July 2019)

Authors:: Rack, Martin; Raskin, Jean-Pierre
Journal:: ECS transactions
Issue:: Volume 92:Number 4(2019)
Page Start:: 79
Record Type:: Journal Article
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2. Behavior of gold-doped silicon substrate under small- and large-RF signal. (June 2020)

Authors:: Nabet, Massinissa; Rack, Martin; Hashim, Nur Zatil Ismah; de Groot, C.H. (Kees); Raskin, Jean-Pierre
Journal:: Solid-state electronics
Issue:: Volume 168(2020)
Page Start:
Record Type:: Journal Article
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3. Effective resistivity extraction of low-loss silicon substrates at millimeter-wave frequencies. Issue 7 (23rd September 2020)

Authors:: Nyssens, Lucas; Rack, Martin; Raskin, Jean-Pierre
Editors:: Ghiotto, A.; Takacs, A.; Nallatamby, J.-C.; Portilla, J.; Dauvignac, J.-Y.; Méric, S.
Journal:: International journal of microwave and wireless technologies
Issue:: Volume 12:Issue 7(2020)
Page Start:: 615
Record Type:: Journal Article
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4. Heat sink implementation in back-end of line for self-heating reduction in 22 nm FDSOI MOSFETs. (October 2021)

Authors:: Halder, Arka; Nyssens, Lucas; Rack, Martin; Lederer, Dimitri; Raskin, Jean-Pierre; Kilchytska, Valeriya
Journal:: Solid-state electronics
Issue:: Volume 184(2021)
Page Start:
Record Type:: Journal Article
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5. Impact of substrate resistivity on spiral inductors at mm-wave frequencies. (August 2022)

Authors:: Nyssens, Lucas; Rack, Martin; Schwan, Christoph; Zhao, Zhixing; Lehmann, Steffen; Hermann, Tom; Allibert, Frederic; Aulnette, Cécile; Lederer, Dimitri; Raskin, Jean-Pierre
Journal:: Solid-state electronics
Issue:: Volume 194(2022)
Page Start:
Record Type:: Journal Article
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6. Post-process porous silicon for 5G applications. (June 2020)

Authors:: Scheen, Gilles; Tuyaerts, Romain; Rack, Martin; Nyssens, Lucas; Rasson, Jonathan; Nabet, Massinissa; Raskin, Jean-Pierre
Journal:: Solid-state electronics
Issue:: Volume 168(2020)
Page Start:
Record Type:: Journal Article
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