1. High‐quality depth up‐sampling based on multi‐scale SLIC. Issue 8 (1st April 2018) Authors: Qiao, Yiguo; Jiao, Licheng; Hou, Biao Journal: Electronics letters Issue: Volume 54:Issue 8(2018) Page Start: 494 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗