High‐quality depth up‐sampling based on multi‐scale SLIC. Issue 8 (1st April 2018)

• Record Type: Journal Article
• Authors: Qiao, Yiguo; Jiao, Licheng; Hou, Biao
• Is Part Of: Electronics letters. Volume 54:Issue 8(2018)
• Page Start: 494
• Page End: 496
• Publication Date: 2018-04-01
• Subjects: pattern clustering -- iterative methods -- image sampling -- image segmentation -- image resolution -- interpolation; multiscale simple linear iterative clustering superpixel -- high‐quality depth up‐sampling method -- high‐resolution image segmentation -- multiscale SLIC superpixel -- depth guided discriminant function -- interpolation; Electronics -- Periodicals; 621.381
• DOI: 10.1049/el.2017.4393
• Languages: English
• ISSNs: 0013-5194

Abstract

Abstract : A multi‐scale simple linear iterative clustering (SLIC)‐based depth up‐sampling method is proposed in order to obtain high‐quality depth maps, especially in the case of high up‐sampling rate. The proposed method is implemented hierarchically, where the high‐resolution image is segmented from coarse to fine by using multi‐scale SLIC superpixels. A depth guided discriminant function is defined to distinguish the validity of the segmented superpixels, and only the valid ones will be interpolated each layer. The experimental results show that the proposed method solves the depth missing and the depth confusion problems largely.