1. Test beam demonstration of silicon microstrip modules with transverse momentum discrimination for the future CMS tracking detector. (6th March 2018) Authors: Adam, W.; Bergauer, T.; Brondolin, E.; Dragicevic, M.; Friedl, M.; Frühwirth, R.; Hoch, M.; Hrubec, J.; König, A.; Steininger, H.; Treberspurg, W.; Waltenberger, W.; Alderweireldt, S.; Beaumont, W.; Janssen, X.; Lauwers, J.; Mechelen, P. Van; Remortel, N. Van; Spilbeeck, A. Van; Beghin, D. Journal: Journal of instrumentation Issue: Volume 13:Number 3(2018:Mar.) Page Start: P03003 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. Trapping in proton irradiated p+-n-n+ silicon sensors at fluences anticipated at the HL-LHC outer tracker. (22nd April 2016) Authors: Adam, W.; Bergauer, T.; Dragicevic, M.; Friedl, M.; Fruehwirth, R.; Hoch, M.; Hrubec, J.; Krammer, M.; Treberspurg, W.; Waltenberger, W.; Alderweireldt, S.; Beaumont, W.; Janssen, X.; Luyckx, S.; Mechelen, P. Van; Remortel, N. Van; Spilbeeck, A. Van; Barria, P.; Caillol, C.; Clerbaux, B. Journal: Journal of instrumentation Issue: Volume 11:Number 4(2016:Apr.) Page Start: P04023 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
3. Experimental study of different silicon sensor options for the upgrade of the CMS Outer Tracker. (22nd April 2020) Authors: Adam, W.; Bergauer, T.; Blöch, D.; Brondolin, E.; Dragicevic, M.; Frühwirth, R.; Hinger, V.; Steininger, H.; Treberer-Treberspurg, W.; Beaumont, W.; Croce, D. Di; Janssen, X.; Lauwers, J.; Mechelen, P. Van; Remortel, N. Van; Blekman, F.; Chhibra, S.S.; Clercq, J. De; D'Hondt, J.; Lowette, S. Journal: Journal of instrumentation Issue: Volume 15:Number 4(2020) Page Start: P04017 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
4. A method to simulate the observed surface properties of proton irradiated silicon strip sensors. (23rd April 2015) Authors: Peltola, T.; Bhardwaj, A.; Dalal, R.; Eber, R.; Eichhorn, T.; Lalwani, K.; Messineo, A.; Printz, M.; Ranjan, K. Journal: Journal of instrumentation Issue: Volume 10:Number 4(2015:Apr.) Page Start: C04025 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
5. T-CAD analysis of electric fields in n-in-p silicon strip detectors in dependence on the p-stop pattern and doping concentration. (28th January 2015) Authors: Printz, M. Journal: Journal of instrumentation Issue: Volume 10:Number 1(2015:Jan.) Page Start: C01048 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗