1. (Invited) Epitaxial CVD Growth of Ultra-Thin Si Passivation Layers on Strained Ge Fin Structures. (1st August 2017) Authors: Loo, Roger; Arimura, Hiroaki; Cott, Daire J.; Witters, Liesbeth; Pourtois, Geoffrey; Schulze, Andreas; Douhard, Bastien; Vanherle, Wendy; Eneman, Geert; Richard, Olivier; Favia, Paola; Mitard, Jerome; Mocuta, Dan; Langer, Robert; Collaert, Nadine Journal: ECS transactions Issue: Volume 80:Number 4(2017) Page Start: 241 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. (Invited) Highly Doped Si1-XGex Epitaxy in View of S/D Applications. (8th September 2020) Authors: Rengo, Gianluca; Porret, Clement; Hikavyy, Andriy Yakovitch; Rosseel, Erik; Nakazaki, Nobuya; Pourtois, Geoffrey; Vantomme, Andre; Loo, Roger Journal: ECS transactions Issue: Volume 98:Number 5(2020) Page Start: 27 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
3. (Invited) Probing the Intrinsic Limitations of the Contact Resistance of Metal/Semiconductor Interfaces through Atomistic Simulations. (16th August 2017) Authors: Pourtois, Geoffrey; Dabral, Ashish; Sankaran, Kiroubanand; Magnus, Wim; Yu, Hao; de Jamblinne de Meux, Albert; Lu, Anh Khoa Augustin; Clima, Sergiu; Stokbro, Kurt; Schaekers, Marc; Houssa, Michel; Collaert, Nadine; Horiguchi, Naoto Journal: ECS transactions Issue: Volume 80:Number 1(2017) Page Start: 303 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
4. (Invited) Stoner Ferromagnetism in Two-Dimensional Materials. (3rd July 2019) Authors: Houssa, Michel; Meng, Ruishen; Iordanidou, Konstantina; Pourtois, Geoffrey; Afanas'ev, Valery V.; Stesmans, Andre Journal: ECS transactions Issue: Volume 92:Number 1(2019) Page Start: 35 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
5. (Invited) Stress Simulations of Fins, Wires, and Nanosheets. (8th September 2020) Authors: Eneman, Geert; Veloso, Anabela; Favia, Paola; Hikavyy, Andriy Yakovitch; Porret, Clement; Arimura, Hiroaki; De Keersgieter, An; Pourtois, Geoffrey; Loo, Roger; Spessot, Alessio; Matagne, Philippe; Ryckaert, J.; Horiguchi, Naoto Journal: ECS transactions Issue: Volume 98:Number 5(2020) Page Start: 253 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
6. (Invited) Sub-40mV Sigma VTH Igzo nFETs in 300mm Fab. (8th September 2020) Authors: Mitard, Jerome; Kljucar, Luka; Rassoul, Nouredine; Dekkers, Harold F. W.; van Setten, Michiel; Chasin, Adrian; Pourtois, Geoffrey; Belmonte, Attilio; Delhougne, Romain; Donadio, Gabriele Luca; Goux, Ludovic; Nag, Manoj; Wilson, Chris; Tokei, Zsolt; Borniquel, Jose Ignacio del agua; Steudel, Soere... Journal: ECS transactions Issue: Volume 98:Number 7(2020) Page Start: 205 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
7. Complex amorphous oxides: property prediction from high throughput DFT and AI for new material search. Issue 23 (26th October 2022) Authors: van Setten, Michiel J.; Dekkers, Hendrik F. W.; Pashartis, Christopher; Chasin, Adrian; Belmonte, Attilio; Delhougne, Romain; Kar, Gouri S.; Pourtois, Geoffrey Journal: Materials advances Issue: Volume 3:Issue 23(2022) Page Start: 8413 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
8. Hole-Doping Induced Ferromagnetism in Monolayer SnO: A First-Principles Study. (16th August 2017) Authors: Houssa, Michel; Iordanidou, Konstantina; Pourtois, Geoffrey; Afanas'ev, Valery V; Stesmans, Andre Journal: ECS transactions Issue: Volume 80:Number 1(2017) Page Start: 339 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
9. Insights into the C Distribution in Si:C/Si:C:P and the Annealing Behavior of Si:C Layers. (18th April 2019) Authors: Dhayalan, Sathish Kumar; Nuytten, Thomas; Pourtois, Geoffrey; Simoen, Eddy; Pezzoli, Fabio; Cinquanta, Eugenio; Bonera, Emiliano; Loo, Roger; Rosseel, Erik; Hikavyy, Andriy; Shimura, Yosuke; Vandervorst, Wilfried Journal: ECS journal of solid state science and technology Issue: Volume 8:Number 4(2019) Page Start: P209 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
10. Insights into the C Distribution in Si:C/Si:C:P and the Annealing Behavior of Si:C Layers. (1st January 2019) Authors: Dhayalan, Sathish Kumar; Nuytten, Thomas; Pourtois, Geoffrey; Simoen, Eddy; Pezzoli, Fabio; Cinquanta, Eugenio; Bonera, Emiliano; Loo, Roger; Rosseel, Erik; Hikavyy, Andriy; Shimura, Yosuke; Vandervorst, Wilfried Journal: ECS journal of solid state science and technology Issue: Volume 8:Number 4(2019) Page Start: P209 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗