1. A Survey Addressing On-Chip Interconnect: Energy and Reliability Considerations. (26th March 2012) Authors: Postman, Jacob; Chiang, Patrick Other Names: Nikolaidis S. Academic Editor. Journal: ISRN electronics Issue: Volume 2012(2012) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗