1. Beware of Artifacts When Characterizing Nanometer Device Features Smaller than a TEM Lamella Thickness in Semiconductor Wafer-foundries. (August 2014) Authors: Zhao, Wayne; Porter, Hugh; Rai, Raghaw; Chen, Esther (PY); Russell, Jeremy Journal: Microscopy and microanalysis Issue: Volume 20(2014)Supplement 3 Page Start: 1000 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. Beware of Artifacts When Characterizing Nanometer Device Features Smaller than a TEM Lamella Thickness in Semiconductor Wafer-foundries. (August 2014) Authors: Zhao, Wayne; Porter, Hugh; Rai, Raghaw; Chen, Esther (PY); Russell, Jeremy Journal: Microscopy and microanalysis Issue: Volume 20:Number 3(2014:Jun.) Page Start: 1000 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
3. Changing indications and antenatal prognostic factors for ex‐utero intrapartum treatment procedures. (9th September 2022) Authors: Porter, Hugh; Trivedi, Amit; Marquez, Miguel; Gibson, Peter; Melov, Sarah J.; Mishra, Umesh; Jani, Pranav; Cheng, Alan T.; Nayyar, Roshni; Alahakoon, Thushari I. Journal: Prenatal diagnosis Issue: Volume 42:Number 11(2022) Page Start: 1420 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
4. Obstructed ileostomy in the third trimester of pregnancy due to compression from the gravid uterus: diagnosis and management. (19th August 2014) Authors: Porter, Hugh; Seeho, Sean Journal: BMJ case reports Issue: Volume 2014 Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗