1. (Invited) Reliability Study of RF Power Amplifiers with GaN-on-SiC HEMTs. (23rd August 2016) Authors: Lang, Jenny; Lim, Jang-Kwon; Hellen, Johan; Nilsson, Torbjörn M.J.; Schodt, Bo; Poder, Ralf; Belov, Ilja; Bakowski, Mietek; Leisner, Peter Journal: ECS transactions Issue: Volume 75:Number 12(2016) Page Start: 49 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗