1. A dedicated and versatile system for testing the radiation hardness of various integrated circuits. (1st January 2023) Authors: Placinta, V.M.; Cojocariu, L.N.; Maciuc, F. Journal: Journal of instrumentation Issue: Volume 18:Number 1(2023) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. Proton-induced radiation effects in the I/O blocks of an SRAM-based FPGA. (16th October 2019) Authors: Placinta, V.M.; Cojocariu, L.N.; Ravariu, C. Journal: Journal of instrumentation Issue: Volume 14:Number 10(2019) Page Start: T10001 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
3. Radiation effects in a SPACIROC2 ASIC and long-term reliability. (19th July 2021) Authors: Placinta, V.M.; Cojocariu, L.N.; de La Taille, C.; Blin-Bondil, S.; Mattiazzo, S.; Silvestrin, L.; Candelori, A.; Maciuc, F. Journal: Journal of instrumentation Issue: Volume 16:Number 7(2021) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗