A dedicated and versatile system for testing the radiation hardness of various integrated circuits. (1st January 2023)

• Record Type: Journal Article
• Authors: Placinta, V.M.; Cojocariu, L.N.; Maciuc, F.
• Is Part Of: Journal of instrumentation. Volume 18:Number 1(2023)
• Publication Date: 2023-01-01
• Subjects: Radiation damage to electronic components -- Data acquisition circuits -- Digital electronic circuits; Scientific apparatus and instruments -- Periodicals; 502.84
• DOI: 10.1088/1748-0221/18/01/C01053
• Languages: English
• ISSNs: 1748-0221

Abstract

Abstract: This work describes the architecture of a versatile system that is dedicated to the testing of various integrated circuits in radiation (e.g., ASICs, FPGAs). The system powers the device under test remotely. It monitors and reads out in real time various parameters, like: power consumption, voltage and current (with resolution of 100 µV and 100 µA, respectively), specific operational parameters of the device under test and its package temperature. A key feature of this system is its multi-channel and remote power supply capabilities, used to power the device under test. It embeds built-in features to detect and record single-event latch-ups, single event upsets and to monitor total ionizing dose cumulative effects. A graphical user interface allows the user to connect and to control the entire system through a dedicated ethernet interface from a safe location zone, and record to disk measurements data.